Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1849431
Reference18 articles.
1. I. Chambouleyron and J. M. Martínez, inHandbook of Thin Films Materials, edited by H. S. Nalwa (Academic, San Diego, 2001), Vol. 3, Chap. 12, pp. 593–622.
2. Retrieval of optical constants and thickness of thin films from transmission spectra
3. Estimation of the Optical Constants and the Thickness of Thin Films Using Unconstrained Optimization
4. Determination of thickness and optical constants of amorphous silicon films from transmittance data
5. Optical constants and thickness determination of very thin amorphous semiconductor films
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