Determination of thickness and optical constants of amorphous silicon films from transmittance data
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1314299
Reference8 articles.
1. Optics of textured amorphous silicon surfaces
2. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
3. Determination of the thickness and optical constants of amorphous silicon
4. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
5. Retrieval of optical constants and thickness of thin films from transmission spectra
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