Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/17/i=10/a=023/pdf
Reference8 articles.
1. A method for the determination of the complex refractive index of non-metallic thin films using photometric measurements at normal incidence
2. Optical constants of rf sputtered hydrogenated amorphous Si
3. Optical properties of thin amorphous silicon and amorphous hydrogenated silicon films produced by ion beam techniques
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