1. Dobrowolski, J. A., Ho, F. C., Waldorf, A.: Determination of optical constants of thin film coating materials based on inverse synthesis. Appl. Opt. 22(20), 3191–3200 (1983).
2. Cathelinaud, M., Lemarquis, F., Amra, C.: Index determination of opaque and semitransparent metallic films: application to light absorbers. Appl. Opt. 41(13), 2546–2554 (2002).
3. Yakubovsky, D. I., Arsenin, A. V., Stebunov, Y. V., Fedyanin, D. Y., Volkov, V. S.: Optical constants and structural properties of thin gold films. Opt. Express. 25(21), 25574–25587 (2017).
4. Solis-Tinoco, V., Acevedo-Barrera, A., Vazquez-Estrada, O., Munguia-Cervantes, J., Hernandez-Como, N., Olguin, L. F., Garcia-Valenzuela, A.: Fast and accurate optical determination of gold-nanofilms thickness. Opt. Laser Technol. 134(106604), 985–989 (2021).
5. Li, G., Zhu, H., Harrison, D. A., Forouhi, A. R., Xu, W.: United States Patent no. US 6,392,756 B1; Method and Apparatus for Optically Determining Physical Parameters of Thin Films Deposited on a Complex Substrate (2002).