β-Ga2O3 FinFETs with ultra-low hysteresis by plasma-free metal-assisted chemical etching

Author:

Huang Hsien-Chih1ORCID,Ren Zhongjie2ORCID,Anhar Uddin Bhuiyan A F M3,Feng Zixuan3,Yang Zhendong2ORCID,Luo Xixi2,Huang Alex Q.2ORCID,Green Andrew4,Chabak Kelson4,Zhao Hongping35ORCID,Li Xiuling12ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Micro and Nanotechnology Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA

2. Department of Electrical and Computer Engineering, Microelectronics Research Center, University of Texas, Austin, Texas 78758, USA

3. Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210, USA

4. Air Force Research Laboratory, Sensors Directorate, WPAFB, Ohio 45433, USA

5. Department of Materials Science and Engineering, The Ohio State University, Columbus Ohio 43210, USA

Abstract

In this work, β-Ga2O3 fin field-effect transistors (FinFETs) with metalorganic chemical vapor deposition grown epitaxial Si-doped channel layer on (010) semi-insulating β-Ga2O3 substrates are demonstrated. β-Ga2O3 fin channels with smooth sidewalls are produced by the plasma-free metal-assisted chemical etching (MacEtch) method. A specific on-resistance (Ron,sp) of 6.5 mΩ·cm2 and a 370 V breakdown voltage are achieved. In addition, these MacEtch-formed FinFETs demonstrate DC transfer characteristics with near zero (9.7 mV) hysteresis. The effect of channel orientation on threshold voltage, subthreshold swing, hysteresis, and breakdown voltages is also characterized. The FinFET with channel perpendicular to the [102] direction is found to exhibit the lowest subthreshold swing and hysteresis.

Funder

National Science Foundation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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