Measurements of current-voltage-induced heating in the Al/SrTiO3−xNy/Al memristor during electroformation and resistance switching
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3238563
Reference15 articles.
1. Switching the electrical resistance of individual dislocations in single-crystalline SrTiO3
2. Recent advances on electromigration in very-large-scale-integration of interconnects
3. Current-induced marker motion in gold wires
4. Resistance switching at the Al/SrTiO3−xNy anode interface
5. Role of Oxygen Vacancies in Cr-Doped SrTiO3 for Resistance-Change Memory
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