Triple axis x‐ray investigations of semiconductor surface corrugations
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.357915
Reference23 articles.
1. Multicrystal X-ray diffraction of heteroepitaxial structures
2. X‐ray diffraction investigation of single step and step‐graded SiGe alloy buffers for the growth of short‐period SimGensuperlattices using reciprocal space mapping
3. High Resolution X-Ray Triple Axis Diffractometry of Short PeriodSimGenSuperlattices
4. High resolution x‐ray diffraction of periodic surface gratings
5. X-ray diffraction from corrugated crystalline surfaces and interfaces
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