X-ray diffraction from corrugated crystalline surfaces and interfaces
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.102759
Reference5 articles.
1. A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
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5. TEM Cross Section Sample Preparation Technique for III–V Compound Semiconductor Device Materials by Chemical Thinning
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