Simultaneous imaging of dielectric properties and topography in a PbTiO3 crystal by near-field scanning microwave microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.126611
Reference10 articles.
1. Quantitative microwave near-field microscopy of dielectric properties
2. Quantitative microwave near-field microscopy of dielectric properties
3. Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films
4. Observation of the First-Order Raman Scattering inSrTiO3Thin Films
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