Uncertainties in the permittivity of thin films extracted from measurements with near field microwave microscopy calibrated by an image charge model
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/25/i=10/a=105601/pdf
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1. Ferroelectrics in Microwave Devices, Circuits and Systems
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1. Broadband, High-Frequency Permittivity Characterization for Epitaxial Ba1−xSrxTiO3 Composition-Spread Thin Films;Physical Review Applied;2021-06-24
2. Dielectric measurement of low-concentration aqueous solutions: assessment of uncertainty and ion-specific responses;Measurement Science and Technology;2018-06-28
3. Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy;IEEE Transactions on Microwave Theory and Techniques;2017-06
4. Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope;Ultramicroscopy;2016-02
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