Broadband, High-Frequency Permittivity Characterization for Epitaxial Ba1−xSrxTiO3 Composition-Spread Thin Films-Reference-Cited by-同舟云学术

Broadband, High-Frequency Permittivity Characterization for Epitaxial Ba1−xSrxTiO3 Composition-Spread Thin Films

Published:2021-06-24 Issue:6 Volume:15 Page:
ISSN:2331-7019
Container-title:Physical Review Applied
language:en
Short-container-title:Phys. Rev. Applied

Author:

Marksz Eric J.^ORCID,Hagerstrom Aaron M.,Zhang Xiaohang,Al Hasan Naila,Pearson Justin,Drisko Jasper A.^ORCID,Booth James C.,Long Christian J.^ORCID,Takeuchi Ichiro,Orloff Nathan D.

Funder

National Institute of Standards and Technology

University of Maryland

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.15.064061/fulltext

Reference54 articles.

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4. Ferroelectric Materials for Microwave Tunable Applications

5. Ferroelectrics in Microwave Devices, Circuits and Systems

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