Scanning capacitance microscopy investigation on InGaAs/InP avalanche photodiode structures: Light-induced polarity reversal
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3216847
Reference16 articles.
1. Scanning capacitance microscopy
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5. Electrical characterization of InGaAs/InP quantum wells by scanning capacitance microscopy
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