Electron‐beam‐induced current determination of minority‐carrier diffusion length and surface recombination velocity in mercury‐cadmium‐telluride
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.335225
Reference5 articles.
1. Electron-Beam-Induced Currents in Semiconductors
2. Peripheral electron‐beam induced current response of a shallowp‐njunction
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4. Spatial distribution of excess carriers in electron-beam excited semiconductors
5. Investigation of minority‐carrier diffusion lengths by electron bombardment of Schottky barriers
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