Peripheral electron‐beam induced current response of a shallowp‐njunction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.332917
Reference7 articles.
1. Electron-Beam-Induced Currents in Semiconductors
2. Injected Current Carrier Transport in a Semi‐Infinite Semiconductor and the Determination of Lifetimes and Surface Recombination Velocities
3. Theory of life time measurements with the scanning electron microscope: Steady state
4. Determination of bulk diffusion length in thin semiconductor layers by SEM-EBIC
5. Advances in the electrical assessment of semiconductors using the scanning electron microscope
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