Characterization of nanometer‐scale epitaxial structures by grazing‐incidence x‐ray diffraction and specular reflectivity
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.339895
Reference10 articles.
1. Untersuchungen zur Totalreflexion von Röntgenstrahlen
2. X-ray scattering studies of thin films and surfaces: thermal oxides on silicon
3. Scattering of X-rays from crystal surfaces
4. Crystal truncation rods and surface roughness
5. X-ray scattering from a single-quantum-well heterostructure
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