X-ray diffraction methods for diagnostics of surface and nanolayers of crystalline structures (review)-Reference-Cited by-同舟云学术

X-ray diffraction methods for diagnostics of surface and nanolayers of crystalline structures (review)

Published:2014-11-25 Issue:15 Volume:50 Page:1459-1469
ISSN:0020-1685
Container-title:Inorganic Materials
language:en
Short-container-title:Inorg Mater

Author:

Lider V. V.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering

Link

http://link.springer.com/content/pdf/10.1134/S0020168514150072.pdf

Reference73 articles.

1. Koval’chuk, M.V., Organic nanomaterials, nanostructures, and nanodiagnostics, Vestn. Ross. Akad. Nauk, 2003, vol. 73, no. 5, pp. 405–411.

2. Iveronova, V.I. and Revkevich, G.P., Teoriya rasseyaniya rentgenovskikh luchei (Theory of X-Ray Scattering), Moscow: Izd. MGU, 1972.

3. Pinsker, Z.G., Dinamicheskoe rasseyanie rentgenovskikh luchei v ideal’nykh kristallakh (Dynamic X-Ray Scattering in Perfect Crystals), Moscow: Nauka, 1974.

4. Blokhin, M.A., Fizika rentgenovskikh luchei. Izd. 2-e (X-Ray Physics. 2nd Edition), Moscow: GITTL, 1957.

5. Andreev, A.V., X-ray surface optics, Usp. Fiz. Nauk, 1985, vol. 145, no. 1, pp. 113–136.

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