Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2777804
Reference25 articles.
1. Current status and future prospects of poly-Si devices
2. Polycrystalline silicon thin-film transistors: A continuous evolving technology
3. A new low-power pMOS poly-Si inverter for AMDs
4. Reliability of low temperature poly-silicon TFTs under inverter operation
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