Author:
Toumi K.,Bourezig Y.,Hamri Y.Z,Belaidi O.
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Investigations on the Light-Induced Degradation of P-Channel Poly-Silicon Thin Film Transistors;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24
2. Off-State Characteristics of Polycrystalline Silicon Thin-Film Transistors under Self-Heating Stress;2022 10th International Symposium on Next-Generation Electronics (ISNE);2023-05-12