Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1850652
Reference23 articles.
1. Ferroelectric Memories
2. Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors
3. Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope
4. Unusual size effect on the polarization patterns in micron-size Pb(Zr,Ti)O3 film capacitors
5. Ultrafast polarization switching in thin-film ferroelectrics
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