Barkhausen noise analysis of thin film ferroelectrics-Reference-Cited by-同舟云学术

Barkhausen noise analysis of thin film ferroelectrics

Published:2020-07-06 Issue:1 Volume:117 Page:012902
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Yazawa Keisuke¹^ORCID,Ducharne Benjamin²^ORCID,Uchida Hiroshi³^ORCID,Funakubo Hiroshi⁴^ORCID,Blendell John E.¹^ORCID

Affiliation:

1. School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907, USA

2. Institut National des Sciences Appliquées de Lyon, Laboratoire Génie Electrique et Ferroélectricité LGEF, 8 rue de la Physique, 69621 Villeurbanne Cedex, France

3. Department of Materials and Life Sciences, Sophia University, Tokyo 102-8554, Japan

4. Department of Materials Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, Tokyo 152-8550, Japan

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0012635

Reference28 articles.

1. Application of a novel type Barkhausen noise sensor to continuous fatigue monitoring

2. I. Altpeter , R. Tschuncky , and K. Szielasko , Materials Characterization Using Nondestructive Evaluation Methods ( Elsevier Inc. 2016), pp. 225–262.

3. Reproducibility of Magnetic Avalanches in an Fe-Ni-Co Ferromagnet

4. Multiple magnetization paths in Barkhausen noise

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