Electrical characterization of metal–insulator–semiconductor capacitors with xerogel as dielectric
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1458065
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1. Power to the package
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4. The effect of sol viscosity on the sol–gel derived low density SiO 2 xerogel film for intermetal dielectric application
5. Aging effect of SiO2 xerogel film on its microstructure and dielectric properties
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