Strain analysis of a Ge micro disk using precession electron diffraction-Reference-Cited by-同舟云学术

Strain analysis of a Ge micro disk using precession electron diffraction

Published:2019-12-21 Issue:23 Volume:126 Page:235701
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Bashir Aneeqa¹^ORCID,Millar Ross W.²^ORCID,Gallacher Kevin²^ORCID,Paul Douglas J.²^ORCID,Darbal Amith D.³^ORCID,Stroud Robert³^ORCID,Ballabio Andrea⁴^ORCID,Frigerio Jacopo⁴^ORCID,Isella Giovanni⁴^ORCID,MacLaren Ian¹^ORCID

Affiliation:

1. School of Physics and Astronomy, University of Glasgow, Kelvin Building, University Avenue, Glasgow G12 8QQ, United Kingdom

2. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, Glasgow G12 8LT, United Kingdom

3. NanoMEGAS USA, 1095 W Rio Salado Parkway, Tempe, Arizona 85281, USA

4. L-NESS, Dipartimento di Fisica del Politecnico di Milano, Polo Territoriale di Como, Via Anzani 42, Como I-22100, Italy

Funder

European Commission

Engineering and Physical Sciences Research Council

Schlumberger Foundation

UK Royal Academy of Engineering Research Fellowship Scheme

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5113761

Reference72 articles.

1. Mobility Enhancement Technology for Scaling of CMOS Devices: Overview and Status

2. Monolithic germanium/silicon avalanche photodiodes with 340 GHz gain–bandwidth product

3. Strong quantum-confined Stark effect in germanium quantum-well structures on silicon

4. Optical modulator on silicon employing germanium quantum wells

5. An electrically pumped germanium laser

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