Individual oxide traps as probes into submicron devices
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.100378
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1. Thermally activated features in1fnoise in silicon on sapphire
2. Tests of Gaussian statistical properties of 1/fnoise
3. Non-Gaussian effects in 1/fnoise in small silicon-on-sapphire resistors
4. 1fnoise in GaAs: Evidence of a new scale invariance
5. Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency (1f?) Noise
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