Secondary electron emission induced by 5–30‐keV monatomic ions striking thin oxide films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.321463
Reference19 articles.
1. Scintillation Type Mass Spectrometer Ion Detector
2. Spectrometer for Measuring Secondary Electron Yields Induced by Ion Impacts on Thin Film Oxide Surfaces
3. Interpretation ofAr+-Ar Collisions at 50 KeV
4. Molecular Wave Functions and Inelastic Atomic Collisions
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