Prediction models of bit errors for NAND flash memory using 200 days of measured data-Reference-Cited by-同舟云学术

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Prediction models of bit errors for NAND flash memory using 200 days of measured data

Published:2019-06 Issue:6 Volume:90 Page:064702
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Wei Debao¹^ORCID,Qiao Liyan¹,Chen Xiaoyu¹,Feng Hua¹,Peng Xiyuan¹

Affiliation:

1. School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin 150080, China

Funder

Fundamental Reserch Funds for the Central Universities

National Natural Science Foundation of China

Heilongjiang Provincial Postdoctoral Science Foundation

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5064655

Reference27 articles.

1. Rate-0.96 LDPC Decoding VLSI for Soft-Decision Error Correction of NAND Flash Memory

2. Threshold Voltage Distribution in MLC NAND Flash Memory: Characterization, Analysis and Modeling

3. Design and optimization of adaptable BCH codecs for NAND flash memories

4. Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled Technology Nodes

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability;IEEE Transactions on Device and Materials Reliability;2023-09

2. Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06

3. Simulation Acceleration of Bit Error Rate Prediction and Yield Optimization of 3D V-NAND Flash Memory;IEEE Access;2023

4. LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning;IEEE Transactions on Computers;2022

5. ADLPT: Improving 3D NAND Flash Memory Reliability By Adaptive Lifetime Prediction Techniques;IEEE Transactions on Computers;2022

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