Sensitivity enhancement in thermoreflectance microscopy of semiconductor devices using suitable probe wavelengths
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2043231
Reference25 articles.
1. Photothermal and electroreflectance images of biased metal-oxide-semiconductor field-effect transistors: Six different kinds of subsurface microscopy
2. Thermoreflectance microscopy applied to the study of electrostatic discharge degradation in metal-oxide-semiconductor field-effect transistors
3. Micro-Temperature Measurements on Semiconductor Laser Mirrors by Reflectance Modulation: A Newly Developed Technique for Laser Characterization
4. Temperature measurements of telecommunication lasers on a micrometre scale
5. Temperature field determination of InGaAsP/InP lasers by photothermal microscopy: Evidence for weak nonradiative processes at the facets
Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Observation of ballistic-diffusive thermal transport in GaN transistors using thermoreflectance thermal imaging;Rare Metals;2023-11-07
2. THERMOREFLECTANCE THERMAL IMAGING INVESTIGATION ON NON-FOURIER HEAT CONDUCTION IN GAN TRANSISTORS;Proceeding of International Heat Transfer Conference 17;2023
3. A Critical Review on the Junction Temperature Measurement of Light Emitting Diodes;Micromachines;2022-09-27
4. Photoacoustic and photothermal and the photovoltaic efficiency of solar cells: A tutorial;Journal of Applied Physics;2022-04-14
5. AFM-thermoreflectance for simultaneous measurements of the topography and temperature;RSC Advances;2018
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3