Bias-voltage application in a hard x-ray photoelectron spectroscopic study of the interface states at oxide/Si(100) interfaces
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4803491
Reference11 articles.
1. High-κ gate dielectrics: Current status and materials properties considerations
2. Ultrathin (<4 nm) SiO2 and Si–O–N gate dielectric layers for silicon microelectronics: Understanding the processing, structure, and physical and electrical limits
3. Decoupling the Fermi-level pinning effect and intrinsic limitations on p-type effective work function metal electrodes
4. (Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation
5. Oxygen migration at Pt/HfO2/Pt interface under bias operation
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