In situ diagnostics of film thickness and surface roughness of diamond films on a Ti–6Al–4V alloy by optical pyrometry
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.121748
Reference5 articles.
1. Insitugrowth rate measurements during molecular beam epitaxy using an optical pyrometer
2. Insitudiamond growth rate measurement using emission interferometry
3. In situ determination of the surface roughness of diamond films using optical pyrometry
4. Determination of Film Growth Rate and Surface Roughness using In-Situ Pyrometry
5. Determination of the optical constants of diamond films with a rough growth surface
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