Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images-Reference-Cited by-同舟云学术

Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images

Published:2018-11-07 Issue:17 Volume:124 Page:174902
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Dorwling-Carter Livie¹,Aramesh Morteza¹,Forró Csaba¹,Tiefenauer Raphael F.¹,Shorubalko Ivan²^ORCID,Vörös János¹,Zambelli Tomaso¹^ORCID

Affiliation:

1. Laboratory of Biosensors and Bioelectronics, ETH Zurich, Gloriastrasse 35, Zurich 8092, Switzerland

2. Laboratory for Transport at Nanoscale Interfaces, Swiss Federal Laboratories for Materials Science and Technology (Empa), Ueberlandstrasse 129, Dübendorf 8600, Switzerland

Funder

Eurostars

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5053879

Reference27 articles.

1. The Scanning Ion-Conductance Microscope

2. Scanning ion conductance microscopy of living cells

3. BIOPHYSICAL APPLICATIONS OF SCANNING ION CONDUCTANCE MICROSCOPY (SICM)

4. Atomic Force Microscope

5. Comparison of Scanning Ion Conductance Microscopy with Atomic Force Microscopy for Cell Imaging

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