Comparison of Scanning Ion Conductance Microscopy with Atomic Force Microscopy for Cell Imaging
Author:
Affiliation:
1. Institute of Applied Physics, University of Erlangen-Nuremberg, Staudtstr. 7, Bldg. A3, 91058 Erlangen, Germany
2. Asylum Research, 6310 Hollister Ave, Santa Barbara, California 93117, United States
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la103275y
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