Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials-Reference-Cited by-同舟云学术

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Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials

Published:2017-10 Issue:10 Volume:88 Page:103104
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Vap Jason C.¹²,Nauyoks Stephen E.³⁴,Benson Michael R.³⁵,Marciniak Michael A.³^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Air Force Institute of Technology, Wright-Patterson AFB, Ohio 45433, USA

2. 846 Test Squadron, Holloman AFB, New Mexico 88330, USA

3. Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson AFB, Ohio 45433, USA

4. Oak Ridge Institute of Science and Education, Belcamp, Maryland 21017, USA

5. Materials and Manufacturing Directorate Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433, USA

Funder

Air Force Research Laboratory (AFRL)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4990003

Reference37 articles.

1. Full Optical Scatter Analysis for Novel Photonic and Infrared Metamaterials

2. Development of a tunable polarimetric scatterometry system in the MWIR and LWIR

3. Development of tunable polarimetric optical scattering instrument from 4.3-9.7 microns

4. Optimization of a dual-rotating-retarder polarimeter as applied to a tunable infrared Mueller-matrix scatterometer

5. Retrieving effective parameters for metamaterials at oblique incidence

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1. Design, fabrication, test, and analysis of an out-of-plane plasmonic optical metasurface;Journal of Nanophotonics;2021-02-12

2. Characterization of the optical performance and scatter of an infrared dielectric metasurface lens;OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT);2021

3. Simulation and modeling of fabricated metasurface optical device measured via polarimetric scatterometer;Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII;2020-08-21

4. Brilliant mid-infrared ellipsometry and polarimetry of thin films: Toward laboratory applications with laser based techniques;Journal of Vacuum Science & Technology B;2019-11

5. Sub-second infrared broadband-laser single-shot phase–amplitude polarimetry of thin films;Optics Letters;2019-08-29

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