Brilliant mid-infrared ellipsometry and polarimetry of thin films: Toward laboratory applications with laser based techniques-Reference-Cited by-同舟云学术

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Brilliant mid-infrared ellipsometry and polarimetry of thin films: Toward laboratory applications with laser based techniques

Published:2019-11 Issue:6 Volume:37 Page:060801
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B
language:en
Short-container-title:Journal of Vacuum Science & Technology B

Author:

Hinrichs Karsten¹^ORCID,Shaykhutdinov Timur¹,Kratz Christoph¹,Furchner Andreas¹^ORCID

Affiliation:

1. Leibniz-Institut für Analytische Wissenschaften—ISAS—e.V., Schwarzschildstr. 8, 12489 Berlin, Germany

Funder

Europäischer Fonds für regionale Entwicklung

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.5122869

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multiscale IR polarimetry of anisotropic nanofibers;Optical Fibers and Sensors for Medical Diagnostics, Treatment and Environmental Applications XXIII;2023-03-06

2. Mid‐infrared dual‐comb polarimetry of anisotropic samples;Natural Sciences;2023-02-14

3. Hyperspectral and time-resolved IR laser polarimetry;Reference Module in Chemistry, Molecular Sciences and Chemical Engineering;2023

4. Mid-infrared laser ellipsometry: a new era beyond FTIR;Advanced Optical Technologies;2022-06-06

5. Resolution Limit in Infrared Chemical Imaging;The Journal of Physical Chemistry C;2022-05-31

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