Low thermal budgetSiO2∕Si3N4∕SiO2 stacks for advanced SONOS memories
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2772580
Reference12 articles.
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4. Nitrogen diffusion and accumulation at the Si∕SiO[sub 2] interface in SiO[sub 2]∕Si[sub 3]N[sub 4]∕SiO[sub 2] structures for nonvolatile semiconductor memories
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