Strain in Thin Metal Films on Quartz
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1708792
Reference4 articles.
1. Thermally Induced Strains in Evaporated Films
2. A method for the examination of crystal sections using penetrating characteristic X radiation
3. Zur Kontrastbreite röntgenographisch abgebildeter Versetzungen
4. X‐RAY DIFFRACTION TOPOGRAPHY OF VIBRATING QUARTZ CRYSTALS
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1. Electrode-stress-induced nanoscale disorder in Si quantum electronic devices;APL Materials;2016-06
2. Deformation field in single-crystal fields semiconductor substrates caused by metallization features;Applied Physics Letters;1999-04-19
3. Strain effects associated with SiO layers evaporated onto GaAs;Journal of Applied Physics;1983-10
4. Mechanical Properties of Non-Metallic Thin Films;Physics of Nonmetallic Thin Films;1976
5. X-Ray Measurement of Lattice Strain Induced by Impurity Diffusion;Journal of the Physical Society of Japan;1975-01-15
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