Thermally Induced Strains in Evaporated Films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1714442
Reference4 articles.
1. X‐Ray Diffractometer Attachment for Direct Observation of Evaporated Thin Films
2. Index of Refraction and Coefficients of Expansion of Optical Glasses at Low Temperatures
3. Index of Refraction and Coefficients of Expansion of Optical Glasses at Low Temperatures
4. Structure and Annealing Behavior of Metal Films Deposited on Substrates near 80 °K: I. Copper Films on Glass
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