Author:
Vook R. W.,Schoening F. R. L.
Cited by
10 articles.
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1. CHARACTERIZATION OF THIN FILMS BY X-RAY DIFFRACTION;Thin Films from Free Atoms and Particles;1985
2. X-Ray Diffraction;Epitaxial Growth;1975
3. Microstructural Characterization of Thin Films;Treatise on Materials Science and Technology;1974
4. An ultra-high-vacuum chamber for high-temperature X-ray diffractometry;Journal of Applied Crystallography;1971-04-01
5. Experimental Techniques;Chemisorption and Reactions on Metallic Films;1971