A new spectroscopic technique for imaging the spatial distribution of nonradiative defects in a scanning transmission electron microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.89590
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1. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
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