Nanothermal characterization of amorphous and crystalline phases in chalcogenide thin films with scanning thermal microscopy-Reference-Cited by-同舟云学术

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Nanothermal characterization of amorphous and crystalline phases in chalcogenide thin films with scanning thermal microscopy

Published:2014-10-07 Issue:13 Volume:116 Page:134904
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Bosse J. L.¹^ORCID,Timofeeva M.²,Tovee P. D.³,Robinson B. J.³,Huey B. D.¹,Kolosov O. V.³

Affiliation:

1. Department of Materials Science & Engineering, University of Connecticut, Storrs, Connecticut 06269-3136, USA

2. Nanotechnology Centre, St. Petersburg Academic University, Chlopina 8/3, 194021 St. Petersburg, Russia

3. Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom

Funder

EU

Engineering and Physical Sciences Research Council (EPSRC)

Basic Energy Sciences (BES)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4895493

Reference50 articles.

1. Breaking the Speed Limits of Phase-Change Memory

2. Reversible Electrical Switching Phenomena in Disordered Structures

3. Time‐resolved reflection and transmission studies of amorphous Ge‐Te thin‐film crystallization

4. Origin of the Optical Contrast in Phase-Change Materials

5. Low-cost and nanoscale non-volatile memory concept for future silicon chips

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