Local C–V mapping for ferroelectrics using scanning nonlinear dielectric microscopy
Author:
Affiliation:
1. Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577, Japan
2. School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama 226-8502, Japan
Funder
Japan Society for the Promotion of Science
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0029630
Reference49 articles.
1. Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories
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1. Nanoscale mapping to assess the asymmetry of local C–V curves obtained from ferroelectric materials;Japanese Journal of Applied Physics;2022-07-27
2. High-precision local C–V mapping for ferroelectrics using principal component analysis;Japanese Journal of Applied Physics;2021-08-02
3. Domains and domain walls in ferroic materials;Journal of Applied Physics;2021-06-21
4. Local C-V Characterization for Ferroelectric Films;2021 IEEE International Symposium on Applications of Ferroelectrics (ISAF);2021-05-16
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