Data-Driven Analysis of High-Resolution Hyperspectral Image Data Sets through Nanoscale Capacitance–Voltage Measurements to Visualize Ferroelectric Domain Dynamics-Reference-Cited by-同舟云学术

Data-Driven Analysis of High-Resolution Hyperspectral Image Data Sets through Nanoscale Capacitance–Voltage Measurements to Visualize Ferroelectric Domain Dynamics

Published:2024-04-09 Issue:8 Volume:7 Page:8525-8536
ISSN:2574-0970
Container-title:ACS Applied Nano Materials
language:en
Short-container-title:ACS Appl. Nano Mater.

Author:

Hiranaga Yoshiomi¹^ORCID,Noguchi Yuki¹²,Mimura Takanori³^ORCID,Shimizu Takao³^ORCID,Funakubo Hiroshi³^ORCID,Cho Yasuo⁴

Affiliation:

1. Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577, Japan

2. School of Engineering, Tohoku University, Sendai 980-0845, Japan

3. School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama 226-8502, Japan

4. New Industry Creation Hatchery Center, Tohoku University, Sendai 980-8579, Japan

Funder

Ministry of Education, Culture, Sports, Science and Technology

Murata Science Foundation

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsanm.3c04636

Reference51 articles.

1. Ferroelectric Memories

2. Ferroelectric tunnel junctions for information storage and processing

3. Challenges and Applications of Emerging Nonvolatile Memory Devices

4. Giant electric-field-induced strains in lead-free ceramics for actuator applications – status and perspective

5. Piezoelectric composites for sensor and actuator applications

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimal Process Design for Wake-Up Free Hf0.5Zr0.5O2 Ferroelectric Capacitors: Toward Low-Power Devices with Enhanced Ferroelectric Performance;Electronics;2024-07-23