Tunneling spectroscopy of electron subbands in thin silicon-on-insulator metal-oxide-semiconductor field-effect transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3360224
Reference17 articles.
1. Visible light emission due to quantum size effects in highly porous crystalline silicon
2. Photoluminescence from a Silicon Quantum Well Formed on Separation by Implanted Oxygen Substrate
3. Photoluminescence fromSi/SiO2single quantum wells by selective excitation
4. Intrinsic origin of visible light emission from silicon quantum wires: Electronic structure and geometrically restricted exciton
5. Confinement, surface, and chemisorption effects on the optical properties of Si quantum wires
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