Gate-bias stress in amorphous oxide semiconductors thin-film transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3187532
Reference20 articles.
1. Toward High-Performance Amorphous GIZO TFTs
2. Bottom-Gate Gallium Indium Zinc Oxide Thin-Film Transistor Array for High-Resolution AMOLED Display
3. High-performance amorphous gallium indium zinc oxide thin-film transistors through N2O plasma passivation
4. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
5. Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
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