Surface photovoltage measured capacitance: Application to semiconductor/electrolyte system
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.331876
Reference10 articles.
1. Determination of surface space–charge capacitance using a light probe
2. A Mercury Contact Probe for MOS Measurements on Oxidized Silicon
3. Applications of Electrochemical Methods for Semiconductor Characterization: I . Highly Reproducible Carrier Concentration Profiling of VPE “Hi‐Lo”
4. Depletion-Layer Photoeffects in Semiconductors
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