Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction-Reference-Cited by-同舟云学术

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Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction

Published:2017-03-20 Issue:12 Volume:110 Page:121905
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Holý V.¹,Kriegner D.¹^ORCID,Lesnik A.²,Bläsing J.²,Wieneke M.²,Dadgar A.²^ORCID,Harcuba P.³

Affiliation:

1. Department of Condensed Matter Physics, Charles University, Ke Karlovu 5, 121 16 Prague, Czech Republic

2. Otto-von-Guericke Universität Magdeburg, FNW/IEP/AHE, Universitätsplatz 2, 39106 Magdeburg, Germany

3. Department of Material Physics, Charles University, Ke Karlovu 5, 121 16 Prague, Czech Republic

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4978870

Reference19 articles.

1. Origin of efficiency droop in GaN-based light-emitting diodes

2. Theoretical Study of Orientation Dependence of Piezoelectric Effects in Wurtzite Strained GaInN/GaN Heterostructures and Quantum Wells

3. Luminescence from stacking faults in gallium nitride

4. Structural TEM study of nonpolara-plane gallium nitride grown on(112¯0)4H-SiC by organometallic vapor phase epitaxy

5. Energetics and electronic structure of stacking faults in AlN, GaN, and InN

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Threading dislocation and lattice stress modulation of Si based GaN material with AlPN nucleation layer;Journal of Luminescence;2023-11

2. Quantitative analysis of lattice plane microstructure in the growth direction of a modified Na-flux GaN crystal using nanobeam X-ray diffraction;Japanese Journal of Applied Physics;2019-05-09

3. Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging;Journal of Applied Physics;2018-08-14

4. Microstructural analysis in the depth direction of a heteroepitaxial AlN thick film grown on a trench-patterned template by nanobeam X-ray diffraction;Journal of Applied Physics;2018-01-10

5. Defect-related anisotropic surface micro-structures of nonpolar a-plane GaN epitaxial films;CrystEngComm;2018

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