Energetics and electronic structure of stacking faults in AlN, GaN, and InN
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.R15052/fulltext
Reference22 articles.
1. High dislocation densities in high efficiency GaN‐based light‐emitting diodes
2. Molecular beam epitaxy of GaN(0001) utilizing NH3 and/or NH+x ions: Growth kinetics and defect structure
3. Defect structure of metal‐organic chemical vapor deposition‐grown epitaxial (0001) GaN/Al2O3
4. Structure of GaN films grown by hydride vapor phase epitaxy
5. Structural characterization of bulk GaN crystals grown under high hydrostatic pressure
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