Automatic Unit for Thinning Transmission Electron Microscopy Specimens of Metals
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1719978
Reference7 articles.
1. Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin Sections
2. Sample Preparation for Transmission Electron Microscopy of Germanium
3. Method of preparing Si and Ge specimens for examination by transmission electron microscopy
4. Microjet method for preparation of wire samples for transmission electron microscopy
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