Microjet method for preparation of wire samples for transmission electron microscopy-Reference-Cited by-同舟云学术

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Microjet method for preparation of wire samples for transmission electron microscopy

Published:1963-11 Issue:11 Volume:40 Page:518-520
ISSN:0950-7671
Container-title:Journal of Scientific Instruments
language:
Short-container-title:J. Sci. Instrum.

Author:

Stickler R,Engle R J

Publisher

IOP Publishing

Subject

General Medicine

Link

http://stacks.iop.org/0950-7671/40/i=11/a=303/pdf

Reference3 articles.

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires;Microscopy Research and Technique;2020-09-11

2. Electropolishing of surfaces: theory and applications;Surface Engineering;2016-07-13

3. Preparation of high quality Al TEM specimens via a double-jet electropolishing technique;Materials Characterization;2008-05

4. Preparation of narrow amorphous ribbon specimens for transmission electron microscopy;Ultramicroscopy;1988-01

5. Improved technique for the preparation of tungsten for TEM;Metallography;1980-02

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