Measurement of valence-band offsets of InAlN/GaN heterostructures grown by metal-organic vapor phase epitaxy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3527058
Reference29 articles.
1. Power electronics on InAlN/(In)GaN: Prospect for a record performance
2. InAlN/GaN Heterostructure Field-Effect Transistors Grown by Plasma-Assisted Molecular-Beam Epitaxy
3. InAlN/GaN HEMTs: a first insight into technological optimization
4. High electron mobility lattice-matched AlInN∕GaN field-effect transistor heterostructures
5. High electron mobility in nearly lattice-matched AlInN∕AlN∕GaN heterostructure field effect transistors
Cited by 57 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Polarization-matching and carrier confinement in III-nitride deep-ultraviolet light-emitting diodes;Journal of Applied Physics;2023-11-08
2. Highly Active Interfacial Sites in SFT‐SnO2 Heterojunction Electrolyte for Enhanced Fuel Cell Performance via Engineered Energy Bands: Envisioned Theoretically and Experimentally;ENERGY & ENVIRONMENTAL MATERIALS;2023-06-23
3. Surface-oxide-controlled InGaAs/InAlAs inverted-type metal-oxide-semiconductor high electron mobility transistors for sub-THz high-power amplifiers;Japanese Journal of Applied Physics;2023-01-23
4. Electron accumulation and distribution at interfaces of hexagonal ScxAl1−xN/GaN- and ScxAl1−xN/InN-heterostructures;Journal of Applied Physics;2022-06-28
5. Surface‐Oxide‐Controlled InAlGaN/GaN High‐Electron‐Mobility Transistors Using Al 2 O 3 ‐Based Insulated‐Gate Structures with H 2 O Vapor Pretreatment;physica status solidi (a);2022-02-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3