Strain, dislocations, and critical dimensions of laterally small lattice‐mismatched semiconductor layers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358822
Reference20 articles.
1. Strained layer heterostructures, and their applications to MODFETs, HBTs, and lasers
2. Film‐edge‐induced stress in substrates
3. Elastic misfit stress relaxation in heteroepitaxial SiGe/Si mesa structures
4. Elastic stress relaxation in SiGe epilayers on patterned Si substrates
5. Calculation of strain distributions at the edge of strained-layer structures
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1. From plastic to elastic stress relaxation in highly mismatched SiGe/Si heterostructures;Acta Materialia;2016-08
2. Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures;Advanced Materials;2015-12-03
3. A prediction of dislocation‐free CdTe/CdS photovoltaic multilayers via nano‐patterning and composition grading;Progress in Photovoltaics: Research and Applications;2015-05-12
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