On the data analysis of light‐biased photoconductance decay measurements
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.360990
Reference11 articles.
1. The study of charge carrier kinetics in semiconductors by microwave conductivity measurements. II.
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3. Impact of illumination level and oxide parameters on Shockley–Read–Hall recombination at the Si‐SiO2interface
4. Analysis of the interaction of a laser pulse with a silicon wafer: Determination of bulk lifetime and surface recombination velocity
5. Surface recombination velocity measurements at the silicon–silicon dioxide interface by microwave‐detected photoconductance decay
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